Optimized 3D Reconstruction of Large, Compact Assemblies of Metallic Nanoparticles

3D characterization of assemblies nanoparticles is great importance to determine their structure–property connection. Such investigations become increasingly more challenging when the larger and compact. In this paper, we propose an optimized approach for electron tomography minimize artifacts related beam broadening in high angle annular dark-field scanning transmission microscopy mode. These are typically present at one side reconstructed data set thick nanoparticle assemblies. To overcome problem, a procedure which two tomographic tilt series same sample acquired. After acquiring first series, flipped over 180°, second By merging reconstructions, blurring volume minimized. Next, combined with advanced three-dimensional reconstruction algorithm yielding quantitative structural information. Here, applied compact assembly spherical Au nanoparticles, but methodology can used investigate broad range samples.